发明名称 Semiconductor apparatus
摘要 A semiconductor apparatus ( 100 ) comprises a low potential reference circuit region ( 1 ) and a high potential reference circuit region ( 2 ), and the high potential reference circuit region ( 2 ) is surrounded by a high withstand voltage separating region ( 3 ). By a trench ( 4 ) formed in the outer periphery of the high withstand voltage separating region ( 3 ), the low potential reference circuit region ( 1 ) and high potential reference circuit region ( 2 ) are separated from each other. Further, the trench ( 4 ) is filled up with an insulating material, and insulates the low potential reference circuit region ( 1 ) and high potential reference circuit region ( 2 ). The high withstand voltage separating region ( 3 ) is partitioned by the trench ( 4 ), high withstand voltage NMOS ( 5 ) or high withstand voltage PMOS ( 6 ) is provided in the partitioned position.
申请公布号 US2007085595(A1) 申请公布日期 2007.04.19
申请号 US20040576292 申请日期 2004.10.08
申请人 TAKI MASATO;TOJIMA HIDEKI 发明人 TAKI MASATO;TOJIMA HIDEKI
分类号 H01L21/76;H03K3/01;H01L21/762;H01L21/8234;H01L27/06;H01L27/08;H01L27/088;H01L27/092;H01L29/06;H01L29/40;H01L29/78;H01L29/786 主分类号 H01L21/76
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