发明名称 ABRASIVE FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, METHOD FOR POLISHING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE MANUFACTURING METHOD
摘要 <p>To provide a polishing technique with which in production of a semiconductor integrated circuit device, when a plane to be polished is polished, an appropriate polishing rate ratio of a polysilicon film to another material can be obtained, whereby high level planarization of a plane to be polished including a polysilicon film can be realized. A polishing compound for chemical mechanical polishing, containing cerium oxide particles, a water-soluble polyamine and water and having a pH within a range of from 10 to 13, is used.</p>
申请公布号 EP1860688(A1) 申请公布日期 2007.11.28
申请号 EP20060714784 申请日期 2006.02.27
申请人 ASAHI GLASS COMPANY, LIMITED;AGC SEIMI CHEMICAL CO., LTD. 发明人 YOSHIDA, IORI;KON, YOSHINORI
分类号 H01L21/304;B24B37/04;C09K3/14 主分类号 H01L21/304
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