| 发明名称 |
RF TESTING SYSTEM WITH PARALLELIZED PROCESSING |
| 摘要 |
An integrated circuit (IC) is provided. The IC includes: an RF transmitter configured to generate an RF signal when the IC has entered a test mode; an RF receiver configured to receive the RF signal in the test mode; and a computation unit having a plurality of processing units that are parallelized to perform a test procedure of the IC according to the received RF signal to determine one or more test results. |
| 申请公布号 |
US2016197685(A1) |
申请公布日期 |
2016.07.07 |
| 申请号 |
US201615071513 |
申请日期 |
2016.03.16 |
| 申请人 |
MediaTek Inc. |
发明人 |
TSAI Chung-Chin;PENG Chun-Hsien |
| 分类号 |
H04B17/17 |
主分类号 |
H04B17/17 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An integrated circuit (IC), comprising:
an RF transmitter configured to generate an RF signal when the IC has entered a test mode; an RF receiver configured to receive the RF signal in the test mode; and a computation unit having a plurality of processing units that are parallelized to perform a test procedure of the IC according to the received RF signal to determine one or more test results. |
| 地址 |
Hsin-Chu TW |
