发明名称 Method of plasma-enhanced atomic layer etching
摘要 A method for etching a layer on a substrate includes at least one etching cycle, wherein an etching cycle includes: continuously providing an inert gas into the reaction space; providing a pulse of an etching gas into the continuous inert gas flow upstream of the reaction space to chemisorb the etching gas in an unexcited state on a surface of the substrate; and providing a pulse of RF power discharge between electrodes to generate a reactive species of the inert gas in the reaction space so that the layer on the substrate is etched.
申请公布号 US9396956(B1) 申请公布日期 2016.07.19
申请号 US201514598532 申请日期 2015.01.16
申请人 ASM IP Holding B.V. 发明人 Fukazawa Atsuki
分类号 H01L21/3065;H01L21/311;H01J37/32;H01L21/3213;H01L21/67 主分类号 H01L21/3065
代理机构 Snell & Wilmer LLP 代理人 Snell & Wilmer LLP
主权项 1. A method for etching a layer on a substrate placed between electrodes in a reaction space by an atomic layer etching (ALE) process which comprises at least one etching cycle, wherein an etching cycle comprises: continuously providing an inert gas flowing at least as a carrier gas for an etching gas into the reaction space, wherein the carrier gas flows through a mass flow controller and then through a gas manifold disposed upstream of the reaction space, said inert gas referring to a gas that does not etch the substrate in an unexcited state; providing a pulse of an etching gas into the continuous inert gas flow upstream of the reaction space to chemisorb the etching gas in an unexcited state on a surface of the substrate in the reaction space, wherein the etching gas flows through a mass flow controller and is converged into the carrier gas flow downstream of the mass flow controller for the carrier gas and upstream of the gas manifold; continuously providing a reactant gas other than the carrier gas and the etching gas into the reaction space, wherein each reaction gas flows through a mass flow controller and is then converged into the etching gas with the carrier gas at the gas manifold; and providing a pulse of RF power discharge between the electrodes to generate a reactive species of the inert gas in the reaction space and to contact the etching gas-chemisorbed surface of the substrate with the reactive species so that the layer on the substrate is etched.
地址 Almere NL