发明名称 PHYSICAL PROPERTY MEASUREMENT BY VERY THIN LIQUID FILM FORMATION SYSTEM
摘要 PURPOSE:To achieve an efficient measurement in a short time with an easy operation, by detecting an electrical signal attributed to physical property of a very thin liquid film itself or an electrical signal generated by a chemical or physical reaction diffusing through the film itself generated in the interface between a solid matter and a very thin liquid film using electrodes. CONSTITUTION:A solid matter A composed of material immune to chemical or physical reaction with an object to be measured is positioned to be put tightly on the surface of electrodes B and B in substance, for example, by placing it simply on the surfaces under its own weight or by applying a slightly pressing force after the placement thereof. Then, a liquid-like object 2 being measured is dripped near the circumference of a contact surface between the solid matter A and the surfaces of the electrodes B and B, for example, using a micropipette 1 and is made to diffuse in permeation entirely through a fine clearance C between the solid matter A and the surfaces of the electrodes B and B by its own surface tension, making a very thin liquid D interposed between the solid matter A and the electrodes B and B. As a results, electrical signals attributed to physical property are detected with the electrodes B and B to measure the concentration of ions by the physical property of the object 2 being measured.
申请公布号 JPS6412259(A) 申请公布日期 1989.01.17
申请号 JP19870168377 申请日期 1987.07.04
申请人 HORIBA LTD 发明人 KOTANI HARUO;TOMITA KATSUHIKO
分类号 G01N27/07;G01N27/28;G01N27/416 主分类号 G01N27/07
代理机构 代理人
主权项
地址