发明名称 METHOD OF MEASURING MAGNETIC FIELDS UTILIZING A THREE DRAM IGFET WITH PARTICULAR BIAS
摘要 A mode of operation of a three-drain configured insulated gate field effect transistor which is extremely sensitive to magnetic fields is disclosed. The gate of the transistor is biased to a level less than transistor threshold, or alternatively, is connected to substrate ground. A first drain region opposite the source is biased to achieve avalanche breakdown of the junction. The other two drains are defined on either side of a line joining the source and first drain. These two drains are biased at a voltage below that required for avalanche of their junctions. In response to a magnetic field a voltage difference is generated across these two drains. In one embodiment of the invention, the region opposite the source is of a conductivity type the same as the substrate. In this configuration the detector does not require avalanche breakdown.
申请公布号 US3714559(A) 申请公布日期 1973.01.30
申请号 USD3714559 申请日期 1971.08.10
申请人 TEXAS INSTRUMENTS INC,US 发明人 BATE R,US
分类号 G01R33/06;H01L29/82;(IPC1-7):G01R33/02 主分类号 G01R33/06
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