| 摘要 |
A semiconductor integrated circuit includes a plurality of data buses (DB1-DB4), and emitter-follower circuits (Q11-Q81, Q12-Q82) arranged in the data buses. Read parts (SA1-SA4), which are coupled to the emitter-follower circuits, read data transferred via the data buses via the emitter-follower circuits. A test part (TC, TC0-TC4), which is coupled to the data buses via the emitter-follower circuits, determines, in a test mode, whether or not the data transferred via the data buses have an error and outputs a test output signal to at least one (DB4) of the data buses. The output test signal has a potential level higher than that of the data transferred via the data buses in a normal mode. <IMAGE> |
