发明名称 Direct etch processes for the manufacture of high density multichip modules
摘要 The process of the manufacture of both the conductive layers and dielectric layers of multichip modules of the deposited variety is set forth with direct etch techniques being substituted for photolithography. Simply stated, entire circuit layers of the modules are directly etched or patterned with the circuit configuration required. Three processes are disclosed for processing the individual layers including subtractive patterning of a metallic conductor layer and direct patterning of the dielectric layer; direct etch metal processing (DEMI) involving direct removal of the metal layer with subsequent direct patterning of the dielectric layer; and, plating form process involving additive metallization and direct etching of the dielectric layer. By utilizing the disclosed processes alone or in combination, fabrication of multichip modules can occur.
申请公布号 US5509553(A) 申请公布日期 1996.04.23
申请号 US19940231704 申请日期 1994.04.22
申请人 LITEL INSTRUMENTS 发明人 HUNTER, JR., ROBERT O.;SMITH, ADLAI H.;MCARTHUR, BRUCE B.
分类号 H01L21/48;H05K1/03;H05K3/00;H05K3/06;H05K3/10;H05K3/24;H05K3/46;(IPC1-7):H01B13/00 主分类号 H01L21/48
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