Test device for testing electronic circuit boards uses interchangeable connection elements that can have different pin configurations with device for moving test head up and down relative to circuit under test

摘要

Device comprises a test pin support (50) for test pins (62). The support (50) is joined with a connection element (90) to form a single unit that can then be exchanged into and out of a test pin support frame (36). An opening between test pin support and a lower support element is for insertion of a circuit board. Adjustment of lower support relative to test pin support is possible.