发明名称 DIRECT VIEW INFRARED MEMS STRUCTURE
摘要 An apparatus and process for forming an infrared imager suitable for night vision surveillance systems. The infrared imager includes an array of field emissive devices formed within a semiconductor substrate (200) such as a silicon wafer. The field emissive devices each include silicon emitters formed within the silicon substrate (200) and a micro-cantilever (245) including a conductive gate plate (275) suspended above the emitters. The micro-cantilever (245) is formed of a bi-material and bends in response to absorbed infrared radiation, locally changing an electric field applied to the structure, and therefore, the emission current of the emitters. Electrons emitted from the emitters form a visible image on a phosphor plate.
申请公布号 WO0037908(A1) 申请公布日期 2000.06.29
申请号 WO1999US30178 申请日期 1999.12.17
申请人 SARNOFF CORPORATION 发明人 BUSTA, HEINZ, HERMANN;AMANTEA, ROBERT
分类号 G01J5/20;(IPC1-7):G01J5/40 主分类号 G01J5/20
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