发明名称 METHODS OF FORMING A NITRIDATED SURFACE ON A METALLIC LAYER AND PRODUCTS PRODUCED THEREBY
摘要 A method of providing a stable interface between a metallic layer and a dielectric layer in a semiconductor device is provided. The method includes generating a remote nitrogen containing plasma and flowing activated nitrogen species, from the remote site to the location of the metallic layer. The activated nitrogen species are flowed over at least the surface of the metallic layer, where they react with the metallic surface to form a metal nitride. The treated layer can be used to provide a stable bottom electrode in a capacitor stack formation.
申请公布号 WO02091452(A2) 申请公布日期 2002.11.14
申请号 WO2002US14890 申请日期 2002.05.08
申请人 APPLIED MATERIALS, INC. 发明人 SAHIN, TURGUT;NARWANKAR, PRAVIN;RAJAGOPALAN, RAVI
分类号 C23C8/02;C23C8/36;C23C14/58;C23C28/00;H01L21/02;H01L21/285;H01L21/316 主分类号 C23C8/02
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