发明名称 |
Mass spectrometry system having ion deflector |
摘要 |
A tandem mass spectrometer and method for calibrating a tandem mass spectrometer. The tandem mass spectrometer comprises first and second mass analyzers. The first and second mass analyzers form an ion path. The second mass analyzer is positioned downstream from the first mass analyzer and is arranged to receive ions from the first mass analyzer. An electrode arrangement positioned between the first and second mass analyzers. The electrode assembly is configured to selectively deflect ions from the ion path.
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申请公布号 |
US2008087809(A1) |
申请公布日期 |
2008.04.17 |
申请号 |
US20060580369 |
申请日期 |
2006.10.13 |
申请人 |
RUSS CHARLES WILLIAM;CRAWFORD ROBERT KEITH;FISCHER STEVEN MICHAEL |
发明人 |
RUSS CHARLES WILLIAM;CRAWFORD ROBERT KEITH;FISCHER STEVEN MICHAEL |
分类号 |
H01J49/26 |
主分类号 |
H01J49/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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