发明名称 |
Semiconductor wafer for use as donor wafer, has layer structure that stands under course or compression stress and another layer structure compensates tension with compression stress or tensile stress |
摘要 |
<p>The semiconductor wafer has a substrate (1) having a substrate material. The layer structure (2) stands under a course or a compression stress and another layer structure compensates tension with compression stress or tensile stress. The substrate material is silicon. The latter layer structure contains a layer, which has a silicon oxide, a silicon oxynitride or a silicon nitride standing under compression stress. The former layer structure has a silicon germanium layer standing under tensile stress. The former layer structure has a gallium arsenide layer standing under tensile stress. An independent claim is also included for a method for producing a semiconductor wafer.</p> |
申请公布号 |
DE102007033449(A1) |
申请公布日期 |
2009.01.29 |
申请号 |
DE20071033449 |
申请日期 |
2007.07.18 |
申请人 |
SILTRONIC AG |
发明人 |
REICHE, MANFRED;GOESELE, ULRICH |
分类号 |
H01L27/12;H01L21/58 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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