发明名称 AUTOMATION METHOD OF MEMORY TEST SYSTEM WITH REAL DEVICE ENVIRONMENT USING BOARD MANAGEMENT CONTROLLER
摘要 The present invention provides a memory mounting test system with a real device environment. The memory mounting test system includes a central processing unit (CPU); a board management controller (BMC); and a voltage regulator module (VRM). The BMC includes a boot-loader which controls power sequence for the system booting of the memory mounting test system. So, the memory mounting test system can be controlled without a separate test board or equipment.
申请公布号 KR20160094124(A) 申请公布日期 2016.08.09
申请号 KR20150015312 申请日期 2015.01.30
申请人 SK HYNIX INC. 发明人 PARK, SUOK KI;KIM, SEUNG JUNE
分类号 G06F11/16;G06F1/26 主分类号 G06F11/16
代理机构 代理人
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