发明名称 |
AUTOMATION METHOD OF MEMORY TEST SYSTEM WITH REAL DEVICE ENVIRONMENT USING BOARD MANAGEMENT CONTROLLER |
摘要 |
The present invention provides a memory mounting test system with a real device environment. The memory mounting test system includes a central processing unit (CPU); a board management controller (BMC); and a voltage regulator module (VRM). The BMC includes a boot-loader which controls power sequence for the system booting of the memory mounting test system. So, the memory mounting test system can be controlled without a separate test board or equipment. |
申请公布号 |
KR20160094124(A) |
申请公布日期 |
2016.08.09 |
申请号 |
KR20150015312 |
申请日期 |
2015.01.30 |
申请人 |
SK HYNIX INC. |
发明人 |
PARK, SUOK KI;KIM, SEUNG JUNE |
分类号 |
G06F11/16;G06F1/26 |
主分类号 |
G06F11/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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