发明名称 A DUAL STACKED METAL-INSULATOR-METAL CAPACITOR AND METHOD FOR MAKING SAME
摘要 A multilayer semiconductor device and method of making a dual stacked metal-insulator-metal (MIM) capacitor of a multilayer semiconductor device, which includes a bottom metal layer including a capacitor plate and a wiring level, an intermediate metal layer forming at least a capacitor plate, and a top metal layer including a capacitor plate and a wiring level, a via that electrically contacts the intermediate metal layer, and at least two electrically connected vias that contact the bottom metal layer and the top metal layer. A dielectric etchstop layer may be formed above the dual stacked MIM capacitor.
申请公布号 US2003197215(A1) 申请公布日期 2003.10.23
申请号 US20030248658 申请日期 2003.02.05
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COOLBAUGH DOUGLAS DUANE;JOSEPH ALVIN JOSE;MALINOWSKI JOHN CHESTER;RAMACHANDRAN VIDHYA
分类号 H01L21/02;H01L21/311;H01L21/768;(IPC1-7):H01L27/108 主分类号 H01L21/02
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