发明名称 Semiconductor device
摘要 A semiconductor device is provided, in which drivability of a transistor in a peripheral circuit region is improved. The peripheral circuit region includes a second semiconductor region formed on the semiconductor substrate, a second gate insulating film thinner than a first gate insulating film, a second gate electrode formed on the second gate insulating film, and source and drain regions formed at both sides of the second gate electrodes in the second semiconductor region and doped with an impurity of first conductivity. The source and drain regions include a p-type low-concentration impurity region having an impurity of first conductivity in relatively low concentration and a p-type high-concentration impurity region having an impurity of first conductivity in relatively high concentration.
申请公布号 US2003213992(A1) 申请公布日期 2003.11.20
申请号 US20020288370 申请日期 2002.11.06
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KUBO SHUNJI
分类号 H01L21/8238;H01L21/8242;H01L27/092;H01L27/108;(IPC1-7):H01L29/792;H01L29/76 主分类号 H01L21/8238
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