发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
The semiconductor device includes: a semiconductor layer in which a trench is formed having a side surface and a bottom surface; a second conductivity-type layer formed on the semiconductor layer on the side surface and the bottom surface of the trench; a first conductivity-type layer formed on the semiconductor layer so as to contact the second conductivity-type layer; a first electrode electrically connected to the first conductivity-type layer; a second electrode embedded in the trench and electrically connected to the second conductivity-type layer; and a barrier-forming layer which is arranged between the second electrode and the side surface of the trench and which, between said barrier-forming layer and the second conductivity-type layer, forms a potential barrier higher than the potential barrier between the second conductivity-type layer and the second electrode. |
申请公布号 |
US2016260830(A1) |
申请公布日期 |
2016.09.08 |
申请号 |
US201615155885 |
申请日期 |
2016.05.16 |
申请人 |
ROHM CO., LTD. |
发明人 |
NAKANO Yuki;NAKAMURA Ryota;SAKAIRI Hiroyuki |
分类号 |
H01L29/78;H01L29/10;H01L29/66;H01L29/16 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a semiconductor layer in which a trench having a side surface and a bottom surface is formed; a second conductivity type layer formed in the semiconductor layer on the side surface and the bottom surface of the trench; a first conductivity type layer formed in the semiconductor layer so as to be contiguous to the second conductivity type layer; a first electrode electrically connected to the first conductivity type layer; a second electrode that is embedded in the trench and that is electrically connected to the second conductivity type layer; and a barrier-forming layer that is disposed between the side surface of the trench and the second electrode and that forms a potential barrier between the barrier-forming layer and the second conductivity type layer higher than a potential barrier between the second conductivity type layer and the second electrode. |
地址 |
Kyoto-shi JP |