发明名称 |
POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN |
摘要 |
The present invention relates to a positive resist composition comprising: (A) a base ingredient whose solubility to an alkaline developing solution is increased by the action of an acid; and (B) an acid generator which generates an acid by light exposure. The base ingredient (A) comprises a polymer compound (A1) having a structural unit (a0) represented by chemical formula (a0-1), a structural unit (a1) derived from an acrylate containing an acid-dissociatable dissolution-inhibiting group, and a structural unit (a3) represented by chemical formula (a3-1) and derived from an acrylate having a hydroxyl group-containing aliphatic hydrocarbon group, wherein the ratio of the structural unit (a3) based on the total structural units forming the polymer compound (A1) is 1-30 mol%. |
申请公布号 |
KR20160113526(A) |
申请公布日期 |
2016.09.29 |
申请号 |
KR20160118409 |
申请日期 |
2016.09.13 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
MATSUMIYA TASUKU;SHIONO DAIJU;HIRANO TOMOYUKI;DAZAI TAKAHIRO;ENDO KOTARO |
分类号 |
G03F7/039;G03F7/004 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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