发明名称 |
MASS SPECTROGRAPH AND ION IMPLANTATION DEVICE EQUIPPED WITH IT |
摘要 |
PROBLEM TO BE SOLVED: To accurately conduct ion beam mass spectrometry by suppressing the arrival of secondary ions generated in a mass separator and left the mass separator at an ion detector. SOLUTION: In this mass spectrometer 20a, a reflection electrode 46 equipped with an ion passing through hole 48 and having a positive voltage V3 applied from a DC power source 50 is provided between a mass separator 26 and an ion detector 32. The level of the positive voltage V3 is set to be smaller than a voltage V1 obtained by converting the kinetic energy of an incident ion beam 6 to a mass separator 26 into an acceleration voltage, and is set to be larger than a voltage V2 obtained by converting the kinetic energy of secondary ions 44 generated in the mass separator 26 into an accelerating voltage.
|
申请公布号 |
JPH11154485(A) |
申请公布日期 |
1999.06.08 |
申请号 |
JP19970336338 |
申请日期 |
1997.11.19 |
申请人 |
NISSIN ELECTRIC CO LTD |
发明人 |
TAKAHASHI MASATO;SAKAI SHIGEKI |
分类号 |
G01T1/29;H01J37/317;H01J49/06;H01L21/265;(IPC1-7):H01J49/06 |
主分类号 |
G01T1/29 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|