Multi-axis inclinometer for measuring inclinations and inclination alterations; has cuvette containing liquid to form datum line with transparent base, unit to illuminate pattern of lines on each of two graticules and imaging optic

摘要

The inclinometer has two graticules (10,11), each with a bar pattern (16,17) of parallel lines (8,9) and illuminated by a light source (6,7). The graticules overlap in an imaging plane (18), which is perpendicular to the liquid (4) surface and in which a CCD line (12a) is also arranged. The graticule lines include an angle, the bisecting line of which is perpendicular to the imaging plane. The two spaced bar patterns are imaged on the CCD line by total reflection at the liquid datum line (2) and through an imaging optic in the form of a plano-convex lens (13). An Independent claim is included for an inclinometer.