| 摘要 |
FIELD: instrumentation and inspection equipment. SUBSTANCE: invention can be employed to test sheets and structural shapes in dynamics. Portable device of automated diagnostics of X- ray thickness gauges has case that houses self-contained power supply unit, analog former of electric signals coming in the form of p simulation networks connected in parallel. Each network incorporates amplifying element built on field-effect transistor and capacitor connected in series with it. Controlling inputs of field-effect transistors are n inputs of former of electric signals. Calibrator of electric signals is connected with input to output of former. In addition device has note-book with information and reference controlling program presenting data base of standards in analogous electric form imitating standard thicknesses of reference measures from materials with various values of effect atomic numbers Zeff. Outputs of note-book are connected to input of analog former. Calibrator comes in the form of transformer which output is connected to input of analog-to-digital converter. Output of the latter is meant for connection to input of tested X-ray thickness gauge. EFFECT: improved metrological characteristics of X-ray thickness gauges, provision for measurement of effective atomic number Zeff of rolled material. 4 dwg |
