发明名称 Semiconductor device and method for manufacturing the same
摘要 An insulated gate field effect transistor comprises a silicon channel region. The silicon is crystallized by heat annealing while a suitable metal element such as nickel helps the crystallization. The crystallization proceeds in the silicon film laterally from the portion where the nickel is directly introduced. The TFT is arranged in such a manner that the source-drain direction of the TFT is aligned with the direction of the crystal growth or intersects with the crystal growth direction at a desired direction.
申请公布号 US6475840(B1) 申请公布日期 2002.11.05
申请号 US19970831088 申请日期 1997.04.01
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MIYANAGA AKIHARU;OHTANI HISASHI;TERAMOTO SATOSHI
分类号 H01L21/20;H01L21/02;H01L21/324;H01L21/336;H01L21/77;H01L21/82;H01L21/84;H01L27/02;H01L27/12;H01L29/02;H01L29/78;H01L29/786;H01L49/00;(IPC1-7):H01L21/00 主分类号 H01L21/20
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