发明名称 |
Scanning electron microscope |
摘要 |
In a scanning electron microscope having the function of observing an attentional object on a specimen, an error in an in-focus position can be corrected at high speeds. When moving the field of view to an object to be observed on a specimen on which an electron beam is scanned, an error between an in-focus position indicated by a mechanism for measuring a height of surface of the specimen and an actual in-focus position is corrected on the basis of information concerning points which are among a plurality of measured points and are adjacent to the target observing point.
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申请公布号 |
US7307253(B2) |
申请公布日期 |
2007.12.11 |
申请号 |
US20050211650 |
申请日期 |
2005.08.26 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
YAMAGUCHI KOHEI;ISOGAI SEIJI;AOKI KAZUO;SAKAMOTO MASASHI |
分类号 |
H01J37/256;G01N23/00 |
主分类号 |
H01J37/256 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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