发明名称 STRUCTURE AND METHOD FOR FORMING FIELD EFFECT TRANSISTOR WITH LOW RESISTANCE CHANNEL REGION
摘要 <p>A trench-gate field effect transistor includes trenches extending into a silicon region of a first conductivity type, and a gate electrodes in each trench. Body regions of second conductivity type extend over the silicon region between adjacent trenches. Each body region forms a first PN junction with the silicon region, and each body region includes a silicon-germanium layer of the second conductivity type laterally extending between adjacent trenches. Source regions of the first conductivity flank the trenches, and each source region forms a second PN junction with one of the body regions. Channel regions extend in the body regions along sidewalls of the trenches between the source regions and a bottom surface of the body regions. The silicon-germanium layers extend into corresponding channel regions to thereby reduce the channel resistance.</p>
申请公布号 WO2009076362(A1) 申请公布日期 2009.06.18
申请号 WO2008US86081 申请日期 2008.12.09
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION;PAN, JAMES;WANG, QI 发明人 PAN, JAMES;WANG, QI
分类号 H01L29/76 主分类号 H01L29/76
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