发明名称 Oxide thin film transistor with a metal oxide etch barrier layer, method of manufacturing the same and display device
摘要 Embodiments of the invention provide a thin film transistor, a method of manufacturing the same, an array substrate comprising the thin film transistor and a display device. The method of manufacturing the thin film transistor comprises steps of forming a gate electrode (220), a gate insulating layer (230), an oxide active layer (240), a source electrode (260) and a drain electrode (270) on a substrate (210). After forming the oxide active layer (240), the method further comprises a step of forming an etch barrier layer (250) of a metal oxide on the oxide active layer (240).
申请公布号 US9397223(B2) 申请公布日期 2016.07.19
申请号 US201314347124 申请日期 2013.12.13
申请人 BOE TECHNOLOGY GROUP CO., LTD 发明人 Jiang Chunsheng;Fang Jingfei
分类号 H01L29/786;H01L29/66;H01L21/02;H01L27/12 主分类号 H01L29/786
代理机构 Collard & Roe, P.C. 代理人 Collard & Roe, P.C.
主权项 1. A method of manufacturing a thin film transistor, comprising steps of forming a gate electrode, a gate insulating layer, an oxide active layer, a source electrode and a drain electrode on a substrate, wherein after forming the oxide active layer, the method further comprises a step of forming an etch barrier layer of a metal oxide on the oxide active layer, the step of forming the etch barrier layer of the metal oxide on the oxide active layer comprises: forming a metal layer on the oxide active layer; and oxidizing the metal layer to form the etch barrier layer of the metal oxide; and the step of forming the metal layer on the oxide active layer comprises: coating a solution comprising metal ions on the oxide active layer, and forming the metal layer on the oxide active layer by a chemical plating process.
地址 Beijing CN