发明名称 Self-aligned gate electrode diffusion barriers
摘要 A structure that provides a diffusion barrier between two doped regions. The structure includes a diffusion barrier including a semiconductor layer comprising a first doped region and a second doped region; and a diffusion barrier separating the first doped region and the second doped region, wherein the diffusion barrier comprises a doped portion and a notch above the doped portion.
申请公布号 US9397174(B2) 申请公布日期 2016.07.19
申请号 US201414516623 申请日期 2014.10.17
申请人 GLOBALFOUNDRIES INC. 发明人 Ellis-Monaghan John J.;Gambino Jeffrey P.;Herrin Russell T.;Schutz Laura J.;Shank Steven M.
分类号 H01L27/092;H01L29/40;H01L21/8238 主分类号 H01L27/092
代理机构 Roberts Mlotkowski Safran & Cole, P.C. 代理人 Lestrange Michael;Calderon Andrew M.;Roberts Mlotkowski Safran & Cole, P.C.
主权项 1. A semiconductor structure comprising: a semiconductor layer comprising a first doped region including a first dopant and a second doped region including a second dopant; and a diffusion barrier separating the first doped region and the second doped region, wherein the diffusion barrier comprises a third doped region including a third dopant different from the first dopant and the second dopant and a notch above the third doped region, wherein the notch has an asymmetric profile from a side view, wherein the notch forms a gap separating the first doped region and the second doped region, wherein the first doped region and the second doped region are oppositely doped, wherein the third doped region is a different region than the first doped region and the second doped region, wherein the first doped region is a different region than the second doped region, wherein the diffusion barrier is self-aligned between the first doped region and the second doped region.
地址 Grand Cayman KY
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