发明名称 |
Self-aligned gate electrode diffusion barriers |
摘要 |
A structure that provides a diffusion barrier between two doped regions. The structure includes a diffusion barrier including a semiconductor layer comprising a first doped region and a second doped region; and a diffusion barrier separating the first doped region and the second doped region, wherein the diffusion barrier comprises a doped portion and a notch above the doped portion. |
申请公布号 |
US9397174(B2) |
申请公布日期 |
2016.07.19 |
申请号 |
US201414516623 |
申请日期 |
2014.10.17 |
申请人 |
GLOBALFOUNDRIES INC. |
发明人 |
Ellis-Monaghan John J.;Gambino Jeffrey P.;Herrin Russell T.;Schutz Laura J.;Shank Steven M. |
分类号 |
H01L27/092;H01L29/40;H01L21/8238 |
主分类号 |
H01L27/092 |
代理机构 |
Roberts Mlotkowski Safran & Cole, P.C. |
代理人 |
Lestrange Michael;Calderon Andrew M.;Roberts Mlotkowski Safran & Cole, P.C. |
主权项 |
1. A semiconductor structure comprising:
a semiconductor layer comprising a first doped region including a first dopant and a second doped region including a second dopant; and a diffusion barrier separating the first doped region and the second doped region,
wherein the diffusion barrier comprises a third doped region including a third dopant different from the first dopant and the second dopant and a notch above the third doped region, wherein the notch has an asymmetric profile from a side view, wherein the notch forms a gap separating the first doped region and the second doped region, wherein the first doped region and the second doped region are oppositely doped, wherein the third doped region is a different region than the first doped region and the second doped region, wherein the first doped region is a different region than the second doped region, wherein the diffusion barrier is self-aligned between the first doped region and the second doped region. |
地址 |
Grand Cayman KY |