发明名称 |
Memory devices and methods of operating the same |
摘要 |
Methods of operating a memory device include; applying a first set write voltage to a selected first signal line connected to a selected memory cell, applying a first inhibition voltage to non-selected first signal lines connected to non-selected memory cells, and controlling a first voltage of a selected second signal line connected to the selected memory cell to be less than the first set write voltage, and a difference between the first inhibition voltage and the first voltage is less than a threshold voltage of the selection element. |
申请公布号 |
US9418739(B2) |
申请公布日期 |
2016.08.16 |
申请号 |
US201514616806 |
申请日期 |
2015.02.09 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Lee Yong-Kyu;Lee Yeong-Taek |
分类号 |
G11C11/00;G11C13/00;G11C11/56 |
主分类号 |
G11C11/00 |
代理机构 |
Volentine & Whitt, PLLC |
代理人 |
Volentine & Whitt, PLLC |
主权项 |
1. A method of operating a memory device including memory cells disposed at respective intersections of bit lines and word lines, wherein each memory cell includes a variable resistor and a selection element, the method comprising:
during a first pre-charge mode, applying a pre-charge voltage to a selected bit line connected to a selected memory cell among the memory cells, non-selected bit lines, and a selected word line connected to the selected memory cell; during a second pre-charge mode following the first pre-charge mode, reducing the pre-charge voltage applied to the non-selected bit lines to a first inhibition voltage; and during an active mode following the second pre-charge mode, applying a first set write voltage greater than the pre-charge voltage to the selected bit line and reducing the pre-charge voltage applied to the selected word line to a voltage higher than the first inhibition voltage. |
地址 |
Suwon-si, Gyeonggi-do KR |