发明名称 INTERNAL TEMPERATURE MEASUREMENT DEVICE AND HEAT-RESISTANCE MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an internal temperature measuring device that can accurately measure (determine) the internal temperature of a measurement object, using a MEMS chip with a thermo-pile.SOLUTION: An internal temperature measuring device is designed to estimate a difference in temperature measured by a thermo-pile 24a when a heat flow Ia alone which adversely affects the accuracy of measuring the internal temperature of a measurement object has entered a top surface part 21 of a MEMS chip and determine the heat-resistance Rx of the measurement object, using the estimation result.SELECTED DRAWING: Figure 6
申请公布号 JP2016170045(A) 申请公布日期 2016.09.23
申请号 JP20150049954 申请日期 2015.03.12
申请人 OMRON CORP 发明人 NAKAGAWA SHINYA
分类号 G01K7/00;G01N25/18 主分类号 G01K7/00
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