| 摘要 |
An X-ray imaging apparatus 1 according to Example 1 comprises an X-ray detector 5 having a configuration wherein scintillator elements are defined by a lattice-like light shielding wall. A portion of X-rays incident on the X-ray detector 5 is incident on the light shielding wall and passes through the X-ray detector 5 without being converted to scintillator light. Therefore, since the X-ray detector 5 that receives X-rays has the scintillator elements defined by the lattice-like light shielding wall, arbitrarily defined, more limited regions of the X-ray detector 5 are allowed to receive X-rays 3a that have passed through a subject M similarly to when X-rays pass through a detection mask. Thus a detection mask from the X-ray imaging apparatus 1 which is used in the EI-XPCi method can be dispensed with, allowing manufacturing costs of the X-ray imaging apparatus 1 to be reduced. |
