发明名称 |
METHOD OF FORMING SEMICONDUCTOR STRUCTURE |
摘要 |
A method of forming a semiconductor structure includes following steps. First of all, a plurality of mandrels is formed on a target layer. Next, a plurality of first liner is formed adjacent to two sides of the mandrels. Then, a plurality of second liners is formed adjacent to two sides of the first liners. After these, a plurality of third liners is formed adjacent to two sides of the second liners. Finally, the mandrels and the second liners are simultaneously removed. |
申请公布号 |
US2016336187(A1) |
申请公布日期 |
2016.11.17 |
申请号 |
US201514737507 |
申请日期 |
2015.06.12 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Liou En-Chiuan;Tung Yu-Cheng |
分类号 |
H01L21/308;H01L29/66;H01L21/8234;H01L21/311 |
主分类号 |
H01L21/308 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a semiconductor structure, comprising:
forming a plurality of mandrels on a target layer; forming a first material layer covering the mandrels; performing an etching back process to remove the first material layer on top surfaces of the mandrels; after the etching back process, performing a chemical mechanical polishing process to further remove a portion of the first material layer to form a plurality of first liners adjacent to two sides of the mandrels; forming a plurality of second liners adjacent to two sides of the first liners; forming a plurality of third liners adjacent to two sides of the second liners; and simultaneously removing the mandrels and the second liners. |
地址 |
Hsin-Chu City TW |