发明名称 METHOD OF FORMING SEMICONDUCTOR STRUCTURE
摘要 A method of forming a semiconductor structure includes following steps. First of all, a plurality of mandrels is formed on a target layer. Next, a plurality of first liner is formed adjacent to two sides of the mandrels. Then, a plurality of second liners is formed adjacent to two sides of the first liners. After these, a plurality of third liners is formed adjacent to two sides of the second liners. Finally, the mandrels and the second liners are simultaneously removed.
申请公布号 US2016336187(A1) 申请公布日期 2016.11.17
申请号 US201514737507 申请日期 2015.06.12
申请人 UNITED MICROELECTRONICS CORP. 发明人 Liou En-Chiuan;Tung Yu-Cheng
分类号 H01L21/308;H01L29/66;H01L21/8234;H01L21/311 主分类号 H01L21/308
代理机构 代理人
主权项 1. A method of forming a semiconductor structure, comprising: forming a plurality of mandrels on a target layer; forming a first material layer covering the mandrels; performing an etching back process to remove the first material layer on top surfaces of the mandrels; after the etching back process, performing a chemical mechanical polishing process to further remove a portion of the first material layer to form a plurality of first liners adjacent to two sides of the mandrels; forming a plurality of second liners adjacent to two sides of the first liners; forming a plurality of third liners adjacent to two sides of the second liners; and simultaneously removing the mandrels and the second liners.
地址 Hsin-Chu City TW