发明名称 残渣層除去方法及び残渣層除去装置
摘要 A method of removing a residue layer formed on a side surface of each of a plurality of convex-shaped structure which stands together on a surface of a substrate or a side surface of a concave-shaped structure formed on the substrate, includes disposing an electrostatic lens between the substrate and a charged particle irradiation mechanism which linearly irradiates a beam of charged particles onto the substrate. The electrostatic lens diverges the beam of charged particles.
申请公布号 JP6030099(B2) 申请公布日期 2016.11.24
申请号 JP20140165946 申请日期 2014.08.18
申请人 東京エレクトロン株式会社 发明人 原 謙一;伏見 直茂
分类号 H01L21/304;H01J37/08;H01J37/12;H01J37/305;H01L21/302;H01L21/3065 主分类号 H01L21/304
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