发明名称 Testing Probe and Testing Apparatus
摘要 A testing probe and a testing apparatus are disclosed. The testing probe including: a housing, including a test end and a fixed end, and with a test opening at the test end; a piston, being capable of sliding between the test end and the fixed end along an inner wall of the housing, and a conductive adhesive agent chamber being formed by the piston and the fixed end of the housing and being configured to be filled with a conductive adhesive agent; and the conductive adhesive agent being allowed to overflow from a gap between the piston and the inner wall of the housing by squeezing the piston; an elastic member with a first end fixed to the piston and a second end extending toward the test end; a sphere being disposed at the test opening and separated from the second end of the elastic member by a preset distance.
申请公布号 US2016356815(A1) 申请公布日期 2016.12.08
申请号 US201615137849 申请日期 2016.04.25
申请人 BOE Technology Group Co., Ltd. ;Hefei BOE Optoelectronics Technology Co., Ltd. 发明人 Wang Jing;Yu Jianyang
分类号 G01R1/067;G02F1/1368 主分类号 G01R1/067
代理机构 代理人
主权项 1. A testing probe comprising: a housing, comprising a test end and a fixed end, and a test opening being provided at the test end; a piston, being disposed inside the housing, capable of sliding between the test end and the fixed end along an inner wall of the housing, and a conductive adhesive agent chamber being formed by the piston and the fixed end of the housing and being configured to be filled with a conductive adhesive agent; and the conductive adhesive agent being allowed to overflow from a gap between the piston and the inner wall of the housing by squeezing the piston; an elastic member, being disposed inside the housing, a first end of the elastic member being fixed to the piston, a second end of the elastic member extending toward the test end, and the elastic member being capable of stretching and compressing in an extending direction of the elastic member; and a sphere disposed inside the housing, and the sphere being disposed at the test opening, and a size of the test opening being smaller than a diameter of the sphere; the sphere being separated from the second end of the elastic member by a preset distance.
地址 Beijing CN