发明名称 |
Testing of a Photovoltaic Panel |
摘要 |
A method for testing a photovoltaic panel connected to an electronic module. The electronic module includes an input attached to the photovoltaic panel and a power output. The method activates a bypass to the electronic module. The bypass provides a low impedance path between the input and the output of the electronic module. A current is injected into the electronic module thereby compensating for the presence of the electronic module during the testing. The current may be previously determined by measuring a circuit parameter of the electronic module. The circuit parameter may be impedance, inductance, resistance or capacitance. |
申请公布号 |
US2016373006(A9) |
申请公布日期 |
2016.12.22 |
申请号 |
US201113015219 |
申请日期 |
2011.01.27 |
申请人 |
Adest Meir;Sella Guy;Handelsman Lior;Galin Yoav;Fishelov Amir;Gazit Meir;Glovinsky Tzachi;Binder Yaron |
发明人 |
Adest Meir;Sella Guy;Handelsman Lior;Galin Yoav;Fishelov Amir;Gazit Meir;Glovinsky Tzachi;Binder Yaron |
分类号 |
G01R31/26;G06F19/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
1. A method for testing a photovoltaic panel connected to an electronic module, said electronic module including an input attached to said photovoltaic panel and a power output, the method comprising the step of:
activating a bypass to the electronic module, wherein said bypass provides a low impedance path between the input and the output of the electronic module; injecting a current into the electronic module thereby compensating for the presence of the electronic module during the testing. |
地址 |
Modiin IL |