发明名称 Testing of a Photovoltaic Panel
摘要 A method for testing a photovoltaic panel connected to an electronic module. The electronic module includes an input attached to the photovoltaic panel and a power output. The method activates a bypass to the electronic module. The bypass provides a low impedance path between the input and the output of the electronic module. A current is injected into the electronic module thereby compensating for the presence of the electronic module during the testing. The current may be previously determined by measuring a circuit parameter of the electronic module. The circuit parameter may be impedance, inductance, resistance or capacitance.
申请公布号 US2016373006(A9) 申请公布日期 2016.12.22
申请号 US201113015219 申请日期 2011.01.27
申请人 Adest Meir;Sella Guy;Handelsman Lior;Galin Yoav;Fishelov Amir;Gazit Meir;Glovinsky Tzachi;Binder Yaron 发明人 Adest Meir;Sella Guy;Handelsman Lior;Galin Yoav;Fishelov Amir;Gazit Meir;Glovinsky Tzachi;Binder Yaron
分类号 G01R31/26;G06F19/00 主分类号 G01R31/26
代理机构 代理人
主权项 1. A method for testing a photovoltaic panel connected to an electronic module, said electronic module including an input attached to said photovoltaic panel and a power output, the method comprising the step of: activating a bypass to the electronic module, wherein said bypass provides a low impedance path between the input and the output of the electronic module; injecting a current into the electronic module thereby compensating for the presence of the electronic module during the testing.
地址 Modiin IL