发明名称 METHOD AND APPARATUS FOR ANALYZING VERY SMALL AMOUNT OF ANION
摘要 PROBLEM TO BE SOLVED: To carry out the analysis of ions wherein a peak is superposed on a water dip in low concn. SOLUTION: Ions in a sample soln. are conc. by using a concn. column 7 and the conc. sample soln. is collected by a concn. valve 5 and a sample loop 6 and the collected sample soln. is fed by a first eluent and the ion group to be analyzed and other ion group in the fed sample soln. are roughly separated. The sample soln. containing the roughly separated ion group to be analyzed is collected by a cutting valve 11 and a sample loop 12 and the collected sample soln. is fed by a second eluent and the ion group to be analyzed is separated and detected by an ion exclusion column 13 and a detector 14.
申请公布号 JPH09257779(A) 申请公布日期 1997.10.03
申请号 JP19960071826 申请日期 1996.03.27
申请人 YOKOGAWA ANALYTICAL SYST KK 发明人 HANAOKA YUZURU;SAKAI TETSUSHI;TAJIMA IKUKO
分类号 G01N30/02;G01N30/08;G01N30/14;G01N30/46;(IPC1-7):G01N30/08 主分类号 G01N30/02
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