发明名称 |
METHOD AND APPARATUS FOR ANALYZING VERY SMALL AMOUNT OF ANION |
摘要 |
PROBLEM TO BE SOLVED: To carry out the analysis of ions wherein a peak is superposed on a water dip in low concn. SOLUTION: Ions in a sample soln. are conc. by using a concn. column 7 and the conc. sample soln. is collected by a concn. valve 5 and a sample loop 6 and the collected sample soln. is fed by a first eluent and the ion group to be analyzed and other ion group in the fed sample soln. are roughly separated. The sample soln. containing the roughly separated ion group to be analyzed is collected by a cutting valve 11 and a sample loop 12 and the collected sample soln. is fed by a second eluent and the ion group to be analyzed is separated and detected by an ion exclusion column 13 and a detector 14. |
申请公布号 |
JPH09257779(A) |
申请公布日期 |
1997.10.03 |
申请号 |
JP19960071826 |
申请日期 |
1996.03.27 |
申请人 |
YOKOGAWA ANALYTICAL SYST KK |
发明人 |
HANAOKA YUZURU;SAKAI TETSUSHI;TAJIMA IKUKO |
分类号 |
G01N30/02;G01N30/08;G01N30/14;G01N30/46;(IPC1-7):G01N30/08 |
主分类号 |
G01N30/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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