发明名称 METHOD AND CONTROL APPARATUS FOR INSPECTING SCAN SIGNAL DEPENDENT OF POSITION
摘要 PROBLEM TO BE SOLVED: To make it passable to display the parameter of a scan signal with high resolution and high accuracy, by making a particularly important parameter of the scan signal recognizable, and obtaining the scan signal of good quality with a simple means. SOLUTION: A measuring scale 1 having an incremental graduation 2 is scanned by a scanning head 3. Scanning elements F1, F2 of the scanning head 3 generate scan signals S1, S2 with a 90 deg. phase shift. The resolution of the scan signal S1, S2 is interpolated to a lower graduation unit so as to obtain better positional measurement value than a graduation cycle of the incremental graduation 2. For the interpolation of high accuracy, the scan signals S1, S2 are shifted correctly by 90 deg. and have a signal amplitude A as high as possible. Moreover, signal amplitudes A1, A2 of the scan signals hold S1=A1sinωt and S2=A2cosωt, respectively. The analog scan signals S1, S2 are fed to a control device 4, so that a parameter (phase position, amplitude) can be inspected particularly effectively by the control device 4.
申请公布号 JPH10160442(A) 申请公布日期 1998.06.19
申请号 JP19970276156 申请日期 1997.10.08
申请人 DR JOHANNES HEIDENHAIN GMBH 发明人 HOLZAPFEL WOLFGANG DR;HUBER ALOIS;BERNHARD ROBERT
分类号 G01B21/00;G01D5/245;G01D5/30;G01D18/00;(IPC1-7):G01B21/00 主分类号 G01B21/00
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