发明名称 FLUORESCENT X-RAY ANALYSIS METHOD AND APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for fluorescent X-ray analysis which can precisely obtain the abundance of an object to be measured. SOLUTION: Illumination directionsϕa,ϕb are determined so that the value, which is obtained by multiplying a fluorescent X-ray intensity Ia2 of a standard sample 2 by PF1/PF2, which is the ratio of the granularity coefficient of a standard sample 1 to that of the standard sample 2, approaches a fluorescent X-ray intensity Ia1 of the standard sample 1. The abundance of the object to be measured is determined from the fluorescent X-ray intensities Ia3, Ib3 for the sample to be measured at the determined illumination directionsϕa,ϕb, to precisely determine the abundance of the object to be measured in the sample to be measured. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004361414(A) 申请公布日期 2004.12.24
申请号 JP20040223426 申请日期 2004.07.30
申请人 RIGAKU INDUSTRIAL CO 发明人 YAMAGAMI MOTOYUKI
分类号 G01N23/223;(IPC1-7):G01N23/223 主分类号 G01N23/223
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