Electro-optical inspection apparatus using electron beam

摘要

An electron beam apparatus for capturing images by deflecting a primary electron beam by a deflector to irradiate each of sub-visual fields which are formed by dividing an evaluation area on a sample surface, and detecting secondary electrons containing information on the sample surface in each of the sub-visual fields by a detecting device. The detecting device includes a plurality of unit detectors each including an area sensor, a bundle of optical fibers having one end coupled to a detection plane of the area sensor, and an FOP coated on the other end of the bundle of optical fibers and formed with a scintillator, on which a secondary electron beam emitted from the respective sub-visual field is focused. An electromagnetic deflector deflects the secondary electron beam each time the electron beam is irradiated to the next sub-visual field to move the secondary electron beams over the surfaces of the FOPs.

主权项

1. An electron beam apparatus, comprising:
an electron gun configured to emit a single primary electron beam; a first deflector configured to deflect the single primary electron beam to irradiate each of a plurality of sub-visual fields which are obtained by dividing an evaluation area on a surface of a sample; a detection device configured to detect secondary electrons containing information on the surface of the sample in each of the plurality of sub-visual fields to acquire information on the evaluation area, said detection device comprising a plurality of unit detectors, each of said plurality of unit detectors including an area sensor, a bundle of optical fibers having a first end coupled to a detection plane of said area sensor, and an FOP optically coupled to a second end of said bundle of optical fibers and formed with a scintillator, on which a secondary electron beam of the sub-visual fields is focused, a second deflector configured to deflect the secondary electron beam emitted from the sub-visual fields each time the single primary electron beam is irradiated to the next sub-visual field, so as to move the secondary electron beam sequentially over a surface of said FOP of each of said plurality of unit detectors which form said detecting device, an electromagnetic objective lens including a lens gap beside the sample and a first axially symmetric electrode therein, said electromagnetic objective lens being configured to form an image produced by the secondary electron beam of the sub-visual fields substantially at the same focusing position in a state in which the sub-visual fields spaced away from the optical axis and the sub-visual fields near the optical axis are irradiated by the single primary electron beam, by adjusting polarities and values of voltages applied to said first axially symmetric electrode, and two electromagnetic magnifying lenses, each of said two electromagnetic magnifying lenses including a second axially symmetric electrode therein and being configured to correct an amount of rotation of the image to match with an arrangement of said FOP of each of said plurality of unit detectors by adjusting polarities and values of voltages applied to said second axially symmetric electrode, a number of said plurality of unit detectors being set to a value approximated to t1/(t2+t3), where t1 represents a time period required to fetch a signal from one area sensor, t2 an exposure time period, and t3 a settling time period of said second deflector, and said FOP of each of said plurality of unit detectors having optical fibers fixed in an array and polished and coated by said scintillator.