发明名称 System and methods for extracting correlation curves for an organic light emitting device
摘要 A system and method for determining and applying characterization correlation curves for aging effects on an organic light organic light emitting device (OLED) based pixel is disclosed. A first stress condition is applied to a reference pixel having a drive transistor and an OLED. An output voltage based on a reference current is measured periodically to determine an electrical characteristic of the reference pixel under the first predetermined stress condition. The luminance of the reference pixel is measured periodically to determine an optical characteristic of the reference pixel. A characterization correlation curve corresponding to the first stress condition including the determined electrical and optical characteristic of the reference pixel is stored. The stress condition of an active pixel is determined and a compensation voltage is determined by correlating the stress condition of the active pixel with curves of the predetermined stress conditions.
申请公布号 US9430958(B2) 申请公布日期 2016.08.30
申请号 US201314027811 申请日期 2013.09.16
申请人 Ignis Innovation Inc. 发明人 Chaji Gholamreza;Jaffari Javid;Nathan Arokia
分类号 G06F3/038;G09G3/00;G09G3/32 主分类号 G06F3/038
代理机构 Nixon Peabody LLP 代理人 Nixon Peabody LLP
主权项 1. A method for determining a characterization correlation curve for aging compensation for an organic light emitting device (OLED) based pixel in a display comprising: applying a first stress condition to a reference device; storing a baseline optical characteristic and a baseline electrical characteristic of the reference device; periodically measuring an output voltage based on a reference current to determine an electrical characteristic of the reference device; periodically measuring the luminance of the reference device to determine an optical characteristic of the reference device; determining a characterization correlation curve corresponding to the first stress condition based on the baseline optical and electrical characteristics and the determined electrical and optical characteristics of the reference device; and storing the characterization correlation curve corresponding to the first stress condition.
地址 Waterloo, Ontario CA