发明名称 BOOSTED VOLTAGE GENERATOR OF SEMICONDUCTOR MEMORY DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To reduce a chip size by properly arranging a boosted voltage generator. SOLUTION: A memory array is divided into a number of banks 21-24 and boosted voltage generators 25-27 which are less than the number of banks are arranged and are controlled by control signals A0-A(m-1) by a control circuit 30. The control circuit 30 generates control signals A0-A(m-1) according to a refresh signal PRFH and row address signals RA-0-RA-(n-1). A boosting operation can be made easily using less number of boosted voltage generators than the number of banks by successively switching when the bank is active, thus reducing the number of boosted voltage generators and hence improving integration.</p>
申请公布号 JPH09180448(A) 申请公布日期 1997.07.11
申请号 JP19960351507 申请日期 1996.12.27
申请人 SAMSUNG ELECTRON CO LTD 发明人 HAI YOUTETSU;IN SEISHIYOU;JO TOICHI
分类号 G11C11/413;G11C5/14;G11C11/401;G11C11/407;H01L21/8242;H01L27/108;(IPC1-7):G11C11/407;H01L21/824 主分类号 G11C11/413
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