| 摘要 |
PROBLEM TO BE SOLVED: To provide a single chip microcomputer capable of reducing test time. SOLUTION: An LSI tester connected to a terminal 12 decides a microcomputer as acceptable when an output from the terminal 12 is '1' about all memory addresses and decides as unacceptable when even one memory address is '0'. For that, a CPU 1 does not have to decide an output value of a zero flip-flop 5 for itself. It is possible to realize the reduction of test time because such processing where the CPU 1 decides the contents of the zero flip-flop 5 to branch them to noncoincidence processing is not needed. It is possible to test the entire memory space by setting not so as to finish a test even if an output of the terminal 12 does not coincide with a test pattern due to the setting of the LSI tester. |
