发明名称 PHOTOMASK UNIT AND CIRCULATION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a photomask and a pellicle to minimize deterioration in the transmittance inside a pellicle frame when the inner space of the pellicle frame of a photomask with the pellicle is replaced by oxygenated gas in photolithography using vacuum ultraviolet (UV) rays such as F2 laser lithography. SOLUTION: A pellicle frame 1(B) is stacked on a mask substrate (A), a pellicle 1(C) is stacked on the pellicle frame 1 (B), a pellicle frame 2(D) is stacked on the pellicle 1(C), and a pellicle 2(E) is tacked on the pellicle frame 2(D). Helium gas is supplied through an aeration port 1(F), while oxygenated helium gas is supplied through an aeration port 2(G). COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005234112(A) 申请公布日期 2005.09.02
申请号 JP20040041525 申请日期 2004.02.18
申请人 SEIKO EPSON CORP 发明人 SASAKI HIRONAO
分类号 B65D81/20;B65D81/24;G03F1/62;G03F1/64;H01L21/027;(IPC1-7):G03F1/14 主分类号 B65D81/20
代理机构 代理人
主权项
地址