发明名称 COMPOUND, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To obtain a compound suitable as an acid generator for resist compositions, an acid generator comprising the compound and a resist composition containing the acid generator and provide a method for forming resist patterns. <P>SOLUTION: The compound is expressed by general formula (b1-3). The resist composition comprises a base component (A) whose alkali solubility changes depending on the action of an acid and an acid generator component (B) which generates the acid upon exposure to light. The acid generator component (B) contains the acid generator (B1) comprising the compound expressed by general formula (b1-3). In the formula, R<SP>41</SP>, R<SP>42</SP>and R<SP>43</SP>express each independently an alkyl, an acetyl, an alkoxy, a carboxy or a hydroxyalkyl; n<SB>1</SB>expresses 0-3 integer; n<SB>2</SB>expresses 0-3 integer; n<SB>3</SB>expresses 0-2 integer, wherein n<SB>1</SB>, n<SB>2</SB>and n<SB>3</SB>do not simultaneously express 0; X<SP>-</SP>expresses an anion. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008024671(A) 申请公布日期 2008.02.07
申请号 JP20060201007 申请日期 2006.07.24
申请人 TOKYO OHKA KOGYO CO LTD 发明人 IWAI TAKESHI;IRIE MAKIKO
分类号 C07D333/54;C07C309/06;C07D333/56;C08F220/26;G03F7/004;G03F7/039 主分类号 C07D333/54
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