| 摘要 |
Provided is a display device. The display device comprises: a plurality of first transistors of which at least a portion is trimmed to be electrically separated from each of the plurality of wiring in the first mounting region; a plurality of second transistors of which at least a portion is trimmed to be electrically separated from each of the plurality of wiring in the second mounting region; a first shorting bar connected to the plurality of first transistors in the first mounting region; and a second shorting bar connected to the plurality of second transistors in the second mounting region. The display device according to one embodiment of the present invention comprises a plurality of second transistors so as to prevent a test signal, applied through the first shorting bar at the time of testing the array of wiring, from getting into the second shorting bar. Therefore, the failure generation of wiring and a failure generation position of wiring can be clearly detected through the array test, thereby improving a production yield rate of the display device. |
