发明名称 Test interface board and test system including the same
摘要 A test interface board includes a substrate including a power plane electrically connected to at least one power terminal of a semiconductor device under test, and a ground plane electrically connected to at least one ground terminal of the semiconductor device under test, and a voltage regulator arranged on the substrate and configured to supply, via the power plane and the ground plane, to the semiconductor device under test, a driving voltage.
申请公布号 US9513333(B2) 申请公布日期 2016.12.06
申请号 US201414458241 申请日期 2014.08.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Song Ki-Jae;Yoo Jong-woon
分类号 G01R31/00;G01R31/30;G01R31/28;G11C29/56;G11C5/14 主分类号 G01R31/00
代理机构 Renaissance IP Law Group LLP 代理人 Renaissance IP Law Group LLP
主权项 1. A test interface board, comprising: a substrate including a power plane electrically connected to at least one power terminal of a semiconductor device under test, and a ground plane electrically connected to at least one ground terminal of the semiconductor device under test; and a voltage regulator arranged on the substrate and configured to supply, via the power plane and the ground plane, to the semiconductor device under test, a driving voltage, wherein the voltage regulator is electrically connected to a power supply, and the voltage regulator comprises: an input terminal to which a power voltage of the power supply is applied; a ground terminal electrically connected to a ground of the power supply and to the ground plane; and an output terminal electrically connected to the power plane, wherein the voltage regulator further comprises a reference voltage generation unit configured to generate a reference voltage, and wherein the output terminal is configured to supply, via the power plane, to the semiconductor device under test, the driving voltage based at least on the reference voltage.
地址 KR