发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To remove residue in a semiconductor device by cleaning the recess formed on an insulating layer with volatile solution. CONSTITUTION:A recess formed by photolithographic technique on a semiconductor layer is cleaned with pure water, is then dried, is then cleaned with volatile solution such as xylene or the like, thereby removing a residue. It is then post-treated with butyl acetate. When thus cleaned, the residue in the previous step can be removed, and no deformation is produced at the resist, thereby performing an accurate patterning.
申请公布号 JPS57106147(A) 申请公布日期 1982.07.01
申请号 JP19800183437 申请日期 1980.12.24
申请人 FUJITSU KK 发明人 KOSHIBA HIROSHI
分类号 H01L21/3205;H01L21/28;H01L21/283;H01L21/302;H01L21/3065 主分类号 H01L21/3205
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