发明名称 |
CRYSTAL GROWTH METHOD FOR NITRIDE SEMICONDUCTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a nitride semiconductor crystal growth method by which a buffer layer and a nitride semiconductor crystal can be grown on a sapphire substrate without causing any lattice defect or dislocation in the crystal, any layer-layer interface roughness. SOLUTION: This crystal growth method comprises an AlN film (buffer layer) growth process for irradiating the surface of a sapphire substrate with atomic nitrogen produced by a plasma method to form an AlN film on the surface of the sapphire substrate. The sapphire substrate is irradiated with such atomic nitrogen while maintaining the temperature of the substrate at <=200 deg.C. Further, a nitride semiconductor crystal growth process using the buffer layer is provided. |
申请公布号 |
JP2002029896(A) |
申请公布日期 |
2002.01.29 |
申请号 |
JP20000203793 |
申请日期 |
2000.07.05 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
CHO SEIKAN;OKUMURA HAJIME;SHIMIZU MITSUTOSHI |
分类号 |
C30B29/38;H01L21/205;H01L33/12;H01L33/32 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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