| 发明名称 |
Method and system for measuring a condition of a structure |
| 摘要 |
A method for measuring a condition of a structure including: moving a measurement probe through a tunnel and measuring the condition of the structure with the measurement probe wherein the tunnel is in electrical potential measurement proximity to the structure.
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| 申请公布号 |
US7190154(B2) |
申请公布日期 |
2007.03.13 |
| 申请号 |
US20050908890 |
申请日期 |
2005.05.31 |
| 申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
BIAGIOTTI, JR. STEPHEN FRANCIS |
| 分类号 |
G01N27/00 |
主分类号 |
G01N27/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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