Semiconductor device arrangement, has temperature measuring arrangement with temperature measuring resistor which is formed over part of semiconductor zone, where evaluation circuit is coupled to temperature measuring resistor

摘要

The arrangement has a trench-transistor with a gate electrode (11), a source-zone (6), a drain-zone (2) and a body-zone (5), where the body-zone is arranged in a semiconductor zone of conduction type. A temperature measuring arrangement has a temperature measuring resistor (13), which is formed over a part of the semiconductor zone, where an evaluation circuit is coupled to the temperature measuring resistor.