发明名称 |
Analyzing interconnect structures |
摘要 |
In one embodiment, an interconnect structure may be analyzed to determine electromagnetic characteristics of the structure by identifying structure seeds corresponding to the structure; modeling the structure seeds to obtain field patterns; and processing the field patterns to obtain the electromagnetic characteristics.
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申请公布号 |
US2004082230(A1) |
申请公布日期 |
2004.04.29 |
申请号 |
US20020281857 |
申请日期 |
2002.10.28 |
申请人 |
JIAO DAN;MAZUMDER MOHIUDDIN;DAI CHANGHONG |
发明人 |
JIAO DAN;MAZUMDER MOHIUDDIN;DAI CHANGHONG |
分类号 |
G06F17/50;H01R9/22;(IPC1-7):H01R9/22 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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