发明名称 形状測定装置、形状測定方法および形状測定プログラム
摘要 PROBLEM TO BE SOLVED: To provide a shape measurement device, a shape measurement method and a shape measurement program that allow a posture of a measurement object to be easily adjusted to an appropriate state for a shape measurement before measuring a shape of the measurement object.SOLUTION: Before measuring a shape, a posture adjustment image based on first three-dimensional shape data on a measurement object S stored in a storage device 240 is displayed on a display part 400. In response to an instruction of changing a posture of the measurement object S on the posture adjustment image, the posture of the measurement object S on the posture adjustment image to be displayed on the display part 400 is changed. When it is assumed that the posture of the measurement object S is adjusted so as to correspond to the posture of the measurement object S on the posture adjustment image displayed on the display part 400 and the measurement object S is irradiated with light, a defect part of second three-dimensional shape data to be generated upon the shape measurement is estimated. The posture adjustment image of the measurement object S is displayed on the display part 400 in a manner capable of discriminating the estimated defect part.
申请公布号 JP5956932(B2) 申请公布日期 2016.07.27
申请号 JP20130001032 申请日期 2013.01.08
申请人 株式会社キーエンス 发明人 田淵 潤
分类号 G01B11/25;G06T1/00;H04N5/225 主分类号 G01B11/25
代理机构 代理人
主权项
地址
您可能感兴趣的专利